HP 4275A MANUAL PDF

This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)

BS A, V Cable: An instrument manufactured after the printing of this manual may have a serial number prefix that is not listed on the title page. A A unit equipped with option or option is suitable for controlling the accurate dc bias required for the measurement. Test Signal Phase on Test Cables Three kinds of con- tact electrode modules are furnished same for the A Test Fixture. HP warrants that its software and firmware designated by HP for use with an in- strument will execute its programming instructions when properly installed on that instrument.

If the sample value exceeds full count number on the selected range, OF OverFlow appears in this dis- play. Data Output Data outputted by the model A Opt.

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Permeability of inductor cores vary with measurement signal level current which differs with range and frequency. By using a string variable complete output information from the A OptJOl is stored by the following program: Special Test Frequency Option.

The meanings of the option annunciations are outlined in paragraph Connect nothing to the test fixture or to test leads as a DUT. Sample Program 2 with the A This program code can be used to monitor the test signal voltage across unknown terminals. Other detailed information for panel displays and controls Is covered in paragraphs and those which follow. Read A capacitance display after allowing time for bias voltage to settle.

Full text of “HP: A Operating”

For higher Q 4275s, refer to General Information. However, the first measurement data of sequential measurement data is invalid. Besides, when the measure- ment purpose is to observe sample values versus the variance of the sample per degree temperature, unit time or other test vari- ables, a direct measurement of this differ- ence makes examination much more meaningful and easier.

When a low capacitance below O. Same as accuracy specifi- cations. The Self Test is a panel pushbutton function for elementary operator checks.

4275A LCR METER

Initial Display and Indications Power Cables Supplied This method, however, cannot be used for inductance measurements on DUTs of from nH manyal 3pH when the test frequency is a special option frequency from 4MHz to Hewlett-Packard uses a two-section nine character serial number which is marked on the serial number plate Figure attached to the instrument rear panel.

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Installation of Optionsand The A is set to be listener. Thus, these accuracy graphs show different Curves for lower and higher measurement values. Remove shorting strap from Test Fixture.

Note that the external bias voltage is pre- sent at Hpot and Hcjr terminals. Depend- ency of the dissipation factor quality factor upon test frequency offers a theoret- ical basis for such inference.

Convenient diagnosis is feasible by merely pressing a panel pushbutton.

Applicable diagrams and equations are given in the chart. Auto Series and Parallel. One of the convenient functions which facilitate ease of operation is the automatic initial control settings performed after the instrument is turned on.

The parameter data displayed by the 3 digit dec- imal numbers are convenient for monitoring, adjusting and recording the test conditions. AC power cord is connected to manula receptacle and ac power line. This operating and service manual con- tains information, cautions, and warnings which must be followed by the user to ensure safe operation and to maintain the instrument in a safe condition.

Hewlett-Packard recommends that you periodically request the latest edition of this supplement. In this way, data is obtained under the virtual operating con- ditions of the device.