This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.
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Ds is D value of known reference sample for extremely low loss references, Ds is zero. When a different measurement is to be at- tempted, press appropriate pushbuttons and select desired functions.
Alternating current power line. Annunciation Display Meanings Figure shows the rough relationships between the appropriate meas- urement circuit mode and sample values.
Special Test Frequency Option. The difference in phase cor- responds to the ratio of the distance between the two points to the wavelength of the pro- pagating signal.
427a Characteristics of Test Fixtures and Leads. For information concerning a serial number prefix that is not listed on the title page or in the Manual Change supplement, con- tact your nearest Hewlett-Packard office.
In a IMHz measurement, for a measure- ment error to be less than 0. Measurement Ranges and Number of Display Digits sheet 3 of 5.
ESR is selected with series circuit mode meas- urement and conductance with parallel circuit mode measure- ment. The deviation measurement func- tion permits such repetitive calculations of the difference between the reference and each individual sample and displays the result on DISPLAY A.
A terminal marked with this symbol must be connected to ground in the manner ph in the installation operating manual, and before operating the equipment. Note ZERO offset adjustment can manuak performed at one specified test frequency. C, L, R, iZiSerror counts: Error in memory back-up opera- tion: Serial Number Plate 1- 3. Measured L, C, R or amnual value is too low compared to the selected range. Measurement parameter formulas for measurement functions are given in Table Measurement range is fixed even when the sample is chang- ed.
If measurement is not achieved because of inappropriate panel control set- tings or yp incorrectly connecting the sample, an alphabetic annunciation either OF, UF, or Err is displayed. Note A Note denotes important information. Error in ZERO offset adjustment.
Mannual A LCR Meter, as shipped from the factory, meets all the specifications listed in TableOn receipt, inspect the shipping container for damage. In the numeric displays, lesser significant digit data is represented by a small zero o figure to differentiate it from a significant figure which is represented by a large zero Note Less significant digit data identi- fy the meaningless numbers related to the uncertainty of the measure- ment result.
Note Other type test fixtures may also be connected. For storing the desired control settings in the memory, proceed as follows: The first four digits and the letter are the se- rial prefix and the last five digits are the suffix.
Index of /~kurt/manuals/manuals/HP Agilent
Polarities of the dc biases normally applied to the sample as well as connections of the measuring circuit are shown in the table. On the other hand, for a high capacitance sample such as an electroly- tic capacitor, the equivalent series resist- ance consisting of lead resistance, electrode resistance, dielectric loss, etc. These pushbuttons select primary component parameter to be measured as follows: Model A and Accessories.
Test Signals Either dissipation factor, quality factor, equivalent series resistance, con- ductance, reactance, susceptance or phase angle can be selected in addition to the choice for L, C, R or 2 1 measurement.